Reliability assessment of an optical current sensor based on accelerated aging tests

Yin Dong; Yu Wenbin; Xiao Zhihong; Han Liu; Wang Guizhong

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Reliability assessment of an optical current sensor based on accelerated aging tests

机译：基于加速老化测试的光电流传感器的可靠性评估

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The operational reliability directly affects the practical application of optical current transformers (OCTs) in smart substations. As the key component of the OCT, the reliability of the optical current sensor (OCS) largely determines the reliability level of the OCT. This paper proposes a reliability assessment method of the OCS based on accelerated aging tests. The failure modes and failure mechanisms of the OCS are analyzed, and the concept of OCS insertion loss variation is proposed. An allowable range of insertion loss variation is selected as the failure criterion of the OCS. From the viewpoint of the OCS measurement error generated by the quantization error of the analog-to-digital converter, the allowable range of insertion loss variation is obtained. By selecting a high temperature as the accelerated thermal stress, we design the accelerated aging test scheme of the OCS and analyze the sample test data to obtain the activation energy of the OCS insertion loss failure. Based on this activation energy, the median time to failure and instantaneous failure rate curve of the OCS at normal temperature are obtained. The results indicate that the designed OCS has an expected service life of 50 years and a low instantaneous failure rate at normal temperature. This paper provides basic critical reliability analysis data for the system reliability assessment of OCTs. (C) 2019 Optical Society of America

机译：操作可靠性直接影响光电流互感器（OCT）在智能变电站中的实际应用。作为OCT的关键部件，光电流传感器（OCS）的可靠性在很大程度上决定了OCT的可靠性水平。本文提出了基于加速老化试验的OC的可靠性评估方法。分析了OC的故障模式和故障机制，提出了OCS插入损耗变化的概念。选择允许的插入损耗变化范围作为OCS的故障标准。从模数转换器的量化误差产生的OCS测量误差的角度来看，获得了允许的插入损耗变化范围。通过选择高温作为加速的热应力，我们设计了OCS的加速老化测试方案，并分析了样品测试数据，以获得OCS插入损失的激活能量。基于该激活能量，获得了正常温度下OC的失效和瞬时故障率曲线的中值时间。结果表明，设计的OCS预期使用寿命为50岁，常温下的瞬时失效率低。本文为OCT的系统可靠性评估提供了基本的关键可靠性分析数据。（c）2019年光学学会

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来源
《Applied optics》 |2019年第18期|共8页
作者
Yin Dong; Yu Wenbin; Xiao Zhihong; Han Liu; Wang Guizhong;
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作者单位

Harbin Inst Technol Sch Elect Engn Harbin 150001 Heilongjiang Peoples R China;

Harbin Inst Technol Sch Elect Engn Harbin 150001 Heilongjiang Peoples R China;

State Grid Econ &

Technol Res Inst Ltd Beijing 100052 Peoples R China;

State Grid Econ &

Technol Res Inst Ltd Beijing 100052 Peoples R China;

Inst Elect Power Sci &

Technol HIT Zhangjiakou Zhangjiakou 075421 Hebei Peoples R China;

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正文语种 eng
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Reliability assessment of an optical current sensor based on accelerated aging tests

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