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Multi-spectra image shift-estimation error calculations using simulated phenomenology

机译:使用模拟现象学的多光谱图像移位估计误差计算

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摘要

Registration of multi-spectral imagery is a critical pre-processing step for applications such as image fusion, but phenomenological differences between spectral bands can lead to significant estimation errors. To develop credible requirements for multi-spectral imaging systems, it is critical to characterize errors, both algorithmic and fundamental, associated with estimating registration parameters; however, attempting to quantify error using archival data sets poses a number of problems. In this paper, we demonstrate the use of commercially available graphics software and available optical property measurements to create fully synthetic, multi-spectral imagery with high-fidelity representations of emissive and reflective phenomenology. We discuss and demonstrate techniques needed to quantify error for both area- and feature-based algorithms. We further show that such synthetic data sets can be used to quantify both the Fisher information and sample errors associated with estimation of the shift between images acquired in different spectral bands and, by extension, estimation of registration model parameters. With the flexibility offered by synthetic data, such characterization can be obtained for robust domains of image brightness, sensor parameters, and differences in image phenomenology. (C) 2018 Optical Society of America
机译:多光谱图像的登记是用于诸如图像融合的应用的关键预处理步骤,但光谱带之间的现象学差异可以导致显着的估计误差。为开发对多光谱成像系统的可信要求,表征误差,算法和基础,与估计登记参数相关的关键是至关重要的;但是,尝试使用归档数据集进行量化错误姿势若干问题。在本文中,我们展示了商业上可用的图形软件和可用的光学特性测量来创建完全合成的多光谱图像,具有发光和反射现象学的高保真表示。我们讨论并展示量化基于区域和特征的算法所需的技术。进一步示出了这种合成数据集可用于量化与在不同光谱带中获取的图像之间的偏移相关联的Fisher信息和采样误差,并且通过扩展估计注册模型参数。利用合成数据提供的灵活性,可以获得这种表征的图像亮度,传感器参数和图像现象学的差异。 (c)2018年光学学会

著录项

  • 来源
    《Applied optics》 |2018年第30期|共16页
  • 作者单位

    Michigan Technol Univ Elect &

    Comp Engn Houghton MI 49931 USA;

    Univ Arizona Univ Blvd Coll Opt Sci 1630 E Univ Blvd Tucson AZ 85721 USA;

    Integr Applicat Inc 15020 Conf Ctr Dr Chantilly VA 20212 USA;

    Integr Applicat Inc 15020 Conf Ctr Dr Chantilly VA 20212 USA;

    Michigan Technol Univ Elect &

    Comp Engn Houghton MI 49931 USA;

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  • 正文语种 eng
  • 中图分类 应用;
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