Accurate estimation of the illumination pattern's orientation and wavelength in sinusoidal structured illumination microscopy

Lahrberg Marcel; Singh Mandeep; Khare Kedar; Ahluwalia Balpreet Singh

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Accurate estimation of the illumination pattern's orientation and wavelength in sinusoidal structured illumination microscopy

机译：正弦结构照明显微镜中的照明模式的方向和波长的精确估计

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Structured illumination microscopy is able to improve the spatial resolution of wide-field fluorescence imaging by applying sinusoidal stripe pattern illumination to the sample. The corresponding computational image reconstruction requires precise knowledge of the pattern's parameters, which are its phase (phi) and wave vector (p). Here, a computationally inexpensive method for estimation of p from the raw data is proposed and illustrated with simulations. The method estimates p through a selective discrete Fourier transform at tunable subpixel precision. This results in an accurate p estimation for all the illumination patterns and subsequently improves the superresolution image recovery by a factor of 10 around sharp edges as compared to an integer pixel approach. The technique as presented here is of major interest to the large variety of custom-build systems that are used. The feasibility of the presented method is proven in comparison with published data. (C) 2018 Optical Society of America

机译：结构化照明显微镜通过将正弦条纹图案照射施加到样品，能够改善宽场荧光成像的空间分辨率。相应的计算图像重建需要精确地了解模式的参数，其是其相位（PHI）和波向量（P）。这里，提出了一种从原始数据估计P的计算上廉价的方法，并用仿真说明。该方法通过可调谐子像素精度来估计P通过选择性离散傅里叶变换。这导致所有照明图案的精确P估计，并且随后与整数像素接近相比，随后将超级大学图像恢复改善10倍左右10倍。这里提出的技术对使用的大量定制构建系统进行了重大兴趣。与已发布的数据相比，证明了所提出的方法的可行性。（c）2018年光学学会

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来源
《Applied optics》 |2018年第5期|共7页
作者
Lahrberg Marcel; Singh Mandeep; Khare Kedar; Ahluwalia Balpreet Singh;
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Univ Tromso Dept Phys &

Technol N-9037 Tromso Norway;

Indian Inst Technol Delhi Dept Phys New Delhi 110016 India;

Indian Inst Technol Delhi Dept Phys New Delhi 110016 India;

Univ Tromso Dept Phys &

Technol N-9037 Tromso Norway;

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Accurate estimation of the illumination pattern's orientation and wavelength in sinusoidal structured illumination microscopy

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