首页> 外文期刊>Applied optics >Weighted spline based integration for reconstruction of freeform wavefront
【24h】

Weighted spline based integration for reconstruction of freeform wavefront

机译:基于加权样条曲线的自由形式波前的重建集成

获取原文
获取原文并翻译 | 示例
           

摘要

In the present work, a spline-based integration technique for the reconstruction of a freeform wavefront from the slope data has been implemented. The slope data of a freeform surface contain noise due to their machining process and that introduces reconstruction error. We have proposed a weighted cubic spline based least square integration method (WCSLI) for the faithful reconstruction of a wavefront from noisy slope data. In the proposed method, the measured slope data are fitted into a piecewise polynomial. The fitted coefficients are determined by using a smoothing cubic spline fitting method. The smoothing parameter locally assigns relative weight to the fitted slope data. The fitted slope data are then integrated using the standard least squares technique to reconstruct the freeform wavefront. Simulation studies show the improved result using the proposed technique as compared to the existing cubic spline-based integration (CSLI) and the Southwell methods. The proposed reconstruction method has been experimentally implemented to a subaperture stitching-based measurement of a freeform wavefront using a scanning Shack-Hartmann sensor. The boundary artifacts are minimal in WCSLI which improves the subaperture stitching accuracy and demonstrates an improved Shack-Hartmann sensor for freeform metrology application. (c) 2018 Optical Society of America
机译:在本作工作中,已经实现了一种基于样条的集成技术,用于从倾斜度数据重建自由形状波前。自由形式表面的斜率数据由于其加工过程而包含噪声,并引入重建误差。我们提出了一种基于加权的立方样条曲线的最小二乘积分法(WCSLI),用于嘈杂的斜坡数据的波前重建波前。在所提出的方法中,测量的斜率数据配合到分段多项式中。通过使用平滑的立方样条拟合方法来确定拟合系数。平滑参数本地分配给安装的斜率数据的相对重量。然后使用标准最小二乘技术集成配合的斜率数据来重建自由形状波前。仿真研究显示了使用所提出的技术的改进结果与现有的基于立方样条线(CSLI)和绍斯威尔方法相比。所提出的重建方法已经通过扫描棚哈特曼传感器实验地实施到基于基于自由形状波前的缝合测量。 WCSLI中的边界伪影在最小的WCSLI中,提高了子射线缝合精度,并演示了用于自由形式计量应用的改进的Shack-Hartmann传感器。 (c)2018年光学学会

著录项

  • 来源
    《Applied optics》 |2018年第5期|共10页
  • 作者单位

    Instruments Res &

    Dev Estab Dehra Dun 248008 Uttar Pradesh India;

    Indian Inst Technol Delhi Instrument Design Dev Ctr New Delhi 110016 India;

    Tech Univ Ilmenau Fachgebiet Tech Opt D-98684 Ilmenau Germany;

    Instruments Res &

    Dev Estab Dehra Dun 248008 Uttar Pradesh India;

    Indian Inst Technol Delhi Instrument Design Dev Ctr New Delhi 110016 India;

    Tech Univ Ilmenau Fachgebiet Tech Opt D-98684 Ilmenau Germany;

    Indian Inst Technol Delhi Instrument Design Dev Ctr New Delhi 110016 India;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用;
  • 关键词

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号