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Coded aperture design in compressive spectral imaging based on side information

机译:基于侧面信息的压缩谱成像中的编码光圈设计

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摘要

Coded aperture compressive spectral imagers (CSI) sense a three-dimensional data cube by using two-dimensional projections of the coded and spectrally dispersed input image. Recently, it has been shown that by combining spectral images acquired from a CSI sensor and a complementary sensor leads to substantial improvement in the quality of the fused image. To maximally exploit the benefits of the complementary information, the spatial structure of the coded apertures must be optimized inasmuch as these structures determine the sensing matrix properties and, accordingly, the quality of the reconstructed images. This paper proposes a method to use side information from a red-green-blue sensor to design the coded aperture patterns of a CSI imager, such that more detailed spatial images and wavelength profiles can be reconstructed. The side information is used as the input of an edge detection algorithm to approximate a version of the edges of the spectral images. The coded apertures are designed to follow the spatial structure determined by the estimated spectral edges, such that the high frequencies are promoted, leading to more detailed reconstructed spectral images. Simulations and experimental results indicate that when compared with random coded aperture structures, the designed coded apertures based on side information obtain up to 3 dB improvement in the quality of the reconstructed images. (C) 2017 Optical Society of America
机译:编码的孔径压缩频谱成像器(CSI)通过使用编码和频谱分散的输入图像的二维投影来感测三维数据立方体。最近,已经示出了通过组合从CSI传感器获取的光谱图像,并且互补传感器导致融合图像的质量的显着提高。为了最大限度地利用互补信息的益处,因此必须优化编码孔的空间结构,因为这些结构确定了感测矩阵属性,因此,重建图像的质量。本文提出了一种从红绿蓝传感器使用侧信息来设计CSI成像器的编码孔径图案的方法,使得可以重建更详细的空间图像和波长分布。侧面信息用作边缘检测算法的输入,以近似光谱图像的边缘的版本。编码孔设计为遵循由估计的频谱边缘确定的空间结构,使得高频被升高,导致更详细的重建光谱图像。模拟和实验结果表明,与随机编码的孔径结构相比,基于侧信息的设计的编码孔径在重建图像的质量上获得高达3dB的提高。 (c)2017年光学学会

著录项

  • 来源
    《Applied optics》 |2017年第22期|共9页
  • 作者单位

    Univ Delaware Dept Elect &

    Comp Engn Newark DE 19716 USA;

    Univ Kentucky Dept Elect &

    Comp Engn Lexington KY 40507 USA;

    Beijing Inst Technol Sch Optoelect Key Lab Photoelect Imaging Technol &

    Syst Beijing 100081 Peoples R China;

    Univ Ind Santander Dept Comp Sci Bucaramanga 680002 Colombia;

    Univ Delaware Dept Elect &

    Comp Engn Newark DE 19716 USA;

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  • 正文语种 eng
  • 中图分类 应用;
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