Simplified model of pinhole imaging for quantifying systematic errors in image shape

Benedetti Laura Robin; Izumi N.; Khan S. F.; Kyrala G. A.; Landen O. L.; Ma T.; Nagel S. R.; Pak A.

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Simplified model of pinhole imaging for quantifying systematic errors in image shape

机译：用于量化图像形状系统误差的针孔成像简化模型

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We examine systematic errors in x-ray imaging by pinhole optics for quantifying uncertainties in the measurement of convergence and asymmetry in inertial confinement fusion implosions. We present a quantitative model for the total resolution of a pinhole optic with an imaging detector that more effectively describes the effect of diffraction than models that treat geometry and diffraction as independent. This model can be used to predict loss of shape detail due to imaging across the transition from geometric to diffractive optics. We find that fractional error in observable shapes is proportional to the total resolution element we present and inversely proportional to the length scale of the asymmetry being observed. We have experimentally validated our results by imaging a single object with differently sized pinholes and with different magnifications.

机译：我们通过针孔光学器件检查X射线成像中的系统误差，用于量化惯性监禁融合爆炸中的收敛性和不对称性的不确定性。我们介绍了具有成像检测器的针孔光学器的总分辨率的定量模型，其更有效地描述了衍射的效果而不是处理几何形状和衍射的模型。该模型可用于预测由于从几何到衍射光学转换的成像而预测形状细节的损失。我们发现观察到的形状中的分数误差与我们所示的总分辨率元素成比例，并且与所观察到的不对称的长度比例成反比。我们通过用不同尺寸的针孔和不同的放大率对单一物体进行了成像，通过实验验证了我们的结果。

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来源
《Applied optics》 |2017年第31期|共13页
作者
Benedetti Laura Robin; Izumi N.; Khan S. F.; Kyrala G. A.; Landen O. L.; Ma T.; Nagel S. R.; Pak A.;
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Lawrence Livermore Natl Lab 7000 East Ave Livermore CA 94550 USA;

Lawrence Livermore Natl Lab 7000 East Ave Livermore CA 94550 USA;

Lawrence Livermore Natl Lab 7000 East Ave Livermore CA 94550 USA;

Los Alamos Natl Lab Box 1663 Los Alamos NM 87545 USA;

Lawrence Livermore Natl Lab 7000 East Ave Livermore CA 94550 USA;

Lawrence Livermore Natl Lab 7000 East Ave Livermore CA 94550 USA;

Lawrence Livermore Natl Lab 7000 East Ave Livermore CA 94550 USA;

Lawrence Livermore Natl Lab 7000 East Ave Livermore CA 94550 USA;

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Simplified model of pinhole imaging for quantifying systematic errors in image shape

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