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首页> 外文期刊>Physica Scripta: An International Journal for Experimental and Theoretical Physics >Enhanced extraction via surface asperities of light generated around the boundary plane in poly (ethylene naphthalate)
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Enhanced extraction via surface asperities of light generated around the boundary plane in poly (ethylene naphthalate)

机译：通过聚（乙烯萘甲酸乙二醇酯）围绕边界平面产生的光表面粗糙的提取

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摘要

Applications of poly (ethylene naphthalate) (PEN) in radiation safety are attractive. However, for worker safety at nuclear power reactors, further enhancements of undoped scintillation materials are required for alpha particle detection. Here, we show that restrictions on the maximum light extraction from PEN can be lifted by controlling its surface conditions. Specifically, 1 mm-thick PEN plates with various degrees of surface asperities were examined. Emission and transmission spectra indicated little effect on the emission wavelengths of the generated light, but large effect on the propagation directions. These features resulted in excellent instrument efficiency for short-range alpha particles in radioactive contamination inspection devices that incorporated PEN having several tens of mu m deep surface scratches. We modelled the relationship between surface asperities and instrument efficiencies for alpha particles by imaging the surface conditions with scanning electron microscopy. Surface asperities led to a quasi-decrease in the critical angle of the light generated around the surface boundary plane, which then resulted in an increase in total internal reflections at the plane. This knowledge should initiate general interest in PEN for radiological management devices.
机译：聚萘二甲酸乙烯酯（PEN）在辐射安全方面的应用十分诱人。然而，为了核动力反应堆的工人安全，α粒子探测需要进一步增强未掺杂闪烁材料。在这里，我们表明，通过控制笔的表面条件，可以解除对笔的最大光提取的限制。具体而言，检查了具有不同程度表面粗糙度的1mm厚笔板。发射光谱和透射光谱表明，对产生的光的发射波长影响不大，但对传播方向影响很大。这些特性使得放射性污染检测设备中的短程α粒子具有优异的仪器效率，该设备包括具有数十μm深表面划痕的PEN。我们通过扫描电子显微镜对表面条件进行成像，模拟了α粒子的表面粗糙度和仪器效率之间的关系。表面粗糙度导致围绕表面边界平面产生的光的临界角准减小，从而导致该平面上的总内反射增加。这方面的知识应该引起人们对辐射管理设备用PEN的普遍兴趣。

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