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首页> 外文期刊>Plasma Sources Science & Technology >Influence of ion-induced secondary electron emission parameters in PICMC plasma simulations with experimental validation in DC cylindrical diode and magnetron discharges
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Influence of ion-induced secondary electron emission parameters in PICMC plasma simulations with experimental validation in DC cylindrical diode and magnetron discharges

机译:DC圆柱二极管二极管和磁控辐射实验验证的PICMC等离子体模拟中离子诱导的二次电子发射参数的影响

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摘要

Niobium thin films are used at CERN (European Organization for Nuclear Research) for coatings of superconducting radio-frequency (SRF) accelerating cavities. Numerical simulations can help to better understand the physical processes involved in such coatings and provide predictions of thin film properties. In this article, particle-in-cellMonte Carlo 3D plasma simulations are validated against experimental data in a coaxial cylindrical system allowing both DC diode and DC magnetron operation. A proper choice of ion induced secondary electron emission parameters enables to match experimental and simulated discharge currents and voltages, with argon as the process gas and niobium as the target element. Langmuir probe measurements are presented to further support simulation results. The choice of argon gas with a niobium target is driven by CERN applications, but the methodology described in this paper is applicable to other discharge gases and target elements.Validation of plasma simulations is the first step towards developing an accurate methodology for predicting thin film coatings characteristics in complex objects such as SRF cavities.
机译:铌薄膜被欧洲核研究组织(CERN)用于超导射频(SRF)加速腔的涂层。数值模拟有助于更好地理解此类涂层中涉及的物理过程,并提供薄膜性能的预测。在这篇文章中,粒子在细胞蒙特卡罗三维等离子体模拟验证了同轴圆柱系统中的实验数据,允许直流二极管和直流磁控管操作。选择合适的离子诱导二次电子发射参数可以匹配实验和模拟的放电电流和电压,以氩为工艺气体,铌为目标元素。Langmuir探针测量结果进一步支持了模拟结果。选择带有铌靶的氩气取决于CERN的应用,但本文所述方法适用于其他放电气体和靶元件。等离子体模拟的验证是开发一种精确的方法来预测复杂物体(如SRF腔)中薄膜涂层特性的第一步。

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