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Comparing two measurement systems using the probability of agreement web app

机译：使用协议Web App的概率比较两个测量系统

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摘要

Measuring precisely and accurately is important for quality assessment of products. Gauge repeatability and reproducibility are the studies conducted to assess precision and accuracy for measuring systems. Two measuring systems are compared when introducing a new system to calibrate the existing one. When introducing a new measuring system which is better and cheaper than the present one, it is necessary to compare to the existing one. Though there are many situations that warrant such comparisons, this study focuses on comparing two measuring systems to examine their interchangeability. There are many studies available on the subject of two as well as multiple measurement systems. One such study uses a multivariate linear model to simultaneously test the equality of measurement variances for multiple systems. Some authors dealt with this problem through Bayesian methods and proposed high density methods for testing of equality. All these studies consider measurement bias as constant across the range of measurement. One proposed method used a structural linear model for replicate measurements. Control chart methodology has also been recommended to deal with bias, linearity and precision of two or more measurement systems. This article describes a methodology to compare two measurement systems based on the probability of agreement (Stevens, Steiner and MacKay, Ref. 1) where the methodology compares two continuous measuring systems. Though the approach was originally developed for medical settings, the article illustrates that this method is applicable for industrial situations. The authors developed a Shiny web application (Shiny, Ref. 2) that has a user-friendly method for comparison.
机译：精确测量对产品质量评估非常重要。量表重复性和再现性是为评估测量系统的精度和准确度而进行的研究。在引入新系统校准现有系统时，比较了两种测量系统。当引入一种比现有测量系统更好、更便宜的新测量系统时，有必要与现有测量系统进行比较。虽然有许多情况需要进行这样的比较，但本研究的重点是比较两种测量系统，以检查它们的互换性。关于两个以及多个测量系统的主题，有许多研究可用。其中一项研究使用多元线性模型同时测试多个系统测量方差的相等性。一些作者通过贝叶斯方法处理了这个问题，并提出了检验等式的高密度方法。所有这些研究都认为测量偏差在测量范围内是恒定的。一种提出的方法使用结构线性模型进行重复测量。控制图方法也被推荐用于处理两个或多个测量系统的偏差、线性和精度。本文描述了一种基于一致性概率比较两个测量系统的方法（Stevens、Steiner和MacKay，参考文献1），其中该方法比较了两个连续测量系统。虽然该方法最初是为医疗环境开发的，但本文说明该方法适用于工业环境。作者开发了一个闪亮的web应用程序（闪亮，参考文献2），它有一个用户友好的比较方法。

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