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首页> 外文期刊>Journal of surface investigation: x-ray, synchrotron and neutron techniques >Structural, Morphological and Dielectric Spectroscopy Analysis of Double Perovskite Bi2MnNiO6 Electronic Material
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Structural, Morphological and Dielectric Spectroscopy Analysis of Double Perovskite Bi2MnNiO6 Electronic Material

机译:双钙钛矿Bi2mnnio6电子材料的结构,形态学和介电光谱分析

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摘要

Exploring as well as examining novel functional double perovskite material represents an important aspect in the field of electronic devices. In this present study the electronic material Bi2MnNiO6 has been framed through high temperature solid state ceramic processing method. Its electronic structure, morphological and electrical characteristics has been evaluated. Its structure is found to be monoclinic through XRD analysis. The uniform and compact grain distribution has been observed form the micrographs. The impedance analysis of the ceramic suggests negative temperature coefficient of resistance behaviour. The important electrical properties associated with this compound may be essential in the development of next generation electronic devices.
机译:探索和研究新型功能性双钙钛矿材料是电子器件领域的一个重要方面。在本研究中,电子材料Bi2MnNiO6通过高温固态陶瓷加工方法制成框架。对其电子结构、形态和电学特性进行了评价。通过XRD分析发现其结构为单斜结构。从显微照片上观察到了均匀致密的晶粒分布。对陶瓷的阻抗分析表明,电阻行为的温度系数为负。与该化合物相关的重要电学性质可能对下一代电子设备的开发至关重要。

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