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首页> 外文期刊>Journal of surface investigation: x-ray, synchrotron and neutron techniques >Resolution of the Dual-Energy Method for Detecting Materials in Radiography
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Resolution of the Dual-Energy Method for Detecting Materials in Radiography

机译:用于检测射线照相中材料的双能方法的分辨率分辨

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摘要

The possibility of applying silicon PIN detectors for recording the X-ray quanta in radiography within the energy range of 25-150 keV is considered with implementation of the dual-energy method. An approach for estimating the method's resolution in determining the composition of materials is proposed. In the case of determining the atomic numbers of six chemical elements for dual-energy pairs, the resolution is quantitatively estimated. Limitations and factors affecting the method resolution are established.
机译:在实施双能量方法时,考虑了在25-150 keV的能量范围内,使用硅PIN探测器记录射线照相中的X射线量子的可能性。提出了一种估算该方法在确定材料成分时分辨率的方法。在确定双能对的六种化学元素的原子序数的情况下,分辨率是定量估计的。确定了影响方法分辨率的限制和因素。

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