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Single-point material recognition by quantum parametric mode sorting and photon counting

机译:量子参数模式分拣和光子计数的单点材料识别

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摘要

We explore an active illumination approach to remote material recognition, based on quantum parametric mode sorting and single-photon detection. By measuring a photon's time of flight at picosecond resolution, 97.8% recognition is demonstrated by illuminating only a single point on the materials. Thanks to the exceptional detection sensitivity and noise rejection, a high recognition accuracy of 96.1% is achieved even when the materials are occluded by a lossy and multiscattering obscurant. (C) 2021 Optical Society of America
机译:我们探索了一种基于量子参数模式分类和单光子检测的主动照明远程材料识别方法。通过以皮秒分辨率测量光子的飞行时间,97.8%的识别率通过仅照亮材料上的一个点来证明。由于其卓越的检测灵敏度和噪声抑制能力,即使材料被有损和多散射遮蔽物遮挡,也能获得96.1%的高识别准确率。(2021)美国光学学会

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  • 来源
    《Applied optics》 |2021年第14期|共4页
  • 作者单位

    Stevens Inst Technol Dept Phys 1 Castle Point Terrace Hoboken NJ 07030 USA;

    Stevens Inst Technol Dept Phys 1 Castle Point Terrace Hoboken NJ 07030 USA;

    Stevens Inst Technol Dept Phys 1 Castle Point Terrace Hoboken NJ 07030 USA;

    Stevens Inst Technol Dept Phys 1 Castle Point Terrace Hoboken NJ 07030 USA;

    Stevens Inst Technol Dept Phys 1 Castle Point Terrace Hoboken NJ 07030 USA;

    Stevens Inst Technol Dept Phys 1 Castle Point Terrace Hoboken NJ 07030 USA;

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  • 正文语种 eng
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