Phase shift imaging in thin films using CW Z-scan based technique

Ba Oumar; Chis Mihaela; Cassagne Christophe; Boudebs Georges

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Phase shift imaging in thin films using CW Z-scan based technique

机译：基于CW Z扫描技术的薄膜相移成像

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The beam waist relative variation (BWRV) method known as a Z-scan based technique is used to demonstrate its feasibility in characterizing the thermal effects induced by a continuous laser beam in different materials. A study of several classical solvent-based solutions (water, ethanol, methanol ...) is carried out before introducing the extension of the BWRV method to laterally map the tested sample. We show that the transverse xy-scan of the sample allows to extract an image of the phase shift due to local thermal heating. This new device, called XYZ-scan, is designed for the thermal characterization of inhomogeneous samples. An example will be given on an inhomogeneous 1.6 mu m thick thin film doped with silver nanoparticles.

机译：束腰相对变化（BWRV）方法被称为基于Z扫描的技术，用于证明其在表征连续激光束在不同材料中引起的热效应方面的可行性。对几种典型溶剂溶液（水、乙醇、甲醇等）的研究在引入BWRV方法的扩展以横向绘制测试样本之前进行。我们表明，样品的横向xy扫描允许提取由于局部热加热而产生的相移图像。这种被称为XYZ扫描的新设备是为非均匀样品的热特性而设计的。将给出一个掺杂银纳米颗粒的1.6μm厚的非均匀薄膜的例子。

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《Physica, B. Condensed Matter》 |2021年第1期|共4页
作者
Ba Oumar; Chis Mihaela; Cassagne Christophe; Boudebs Georges;
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作者单位

Univ Angers LPHIA F-49000 Angers France;

ESAIP 18 Rue 8 Mai 1945 CS 80022 F-49180 St Barthelemy Anjou France;

Univ Angers LPHIA F-49000 Angers France;

Univ Angers LPHIA F-49000 Angers France;

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原文格式 PDF
正文语种 eng
中图分类物理学;
关键词
Thermo-optical heating; Thermal lens; Phase shift; Z-scan; Linear absorption;

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3. Phase shift of polarized light through sculptured thin films:Experimental measurements and theoretical study [J] . Hou Yong-Qiang, Qi Hong-Ji, Li Xu, 中国物理：英文版 . 2013,第012期
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8. Studying the Linear and Nonlinear Optical Properties by Using Z-Scan Technique for CdS Thin Films Prepared by CBD Technique [J] . Ahmed S. Jabbar, Sabah I. Abbas, Muneer H. Al-zubaidy Applied Physics Research . 2018,第3期

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机译：基于Ba（0.60）sr（0.40）TiO3薄膜移相器的K波段线性相控阵天线

Phase shift imaging in thin films using CW Z-scan based technique

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