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首页> 外文期刊>Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology >Synthesis of boron-doped diamond films by DC plasma CVD using a CH4+CO2+H-2 gas mixture at lower substrate temperature and formation of an n-Si/p-diamond heterojunction
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Synthesis of boron-doped diamond films by DC plasma CVD using a CH4+CO2+H-2 gas mixture at lower substrate temperature and formation of an n-Si/p-diamond heterojunction

机译:DC等离子体CVD合成硼掺杂的钻石膜,使用CH4+CO2+H-2气体混合物在较低的底物温度下和N-SI/P-Diamond heteroJunction的形成下形成

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摘要

Diamond films were synthesized by direct current plasma chemical vapour deposition using a CH4 + CO2 + H-2 gas mixture on Si substrates. The optimum deposition conditions were determined. It was found that 0.4 A/cm(2) current density. at applied voltage of 1 kV, resulted in good-quality diamond films. The substrate temperature was 750 K which is considerably lower than the conventional requirement of similar to1100 K. Boron doping was achieved by passing a portion of the gas mixture through boric acid dissolved in methanol. The boron-doped p-type diamond films were deposited on an n-type single crystalline Si substrate and an n-Si/p-diamond heterojunction was fabricated. The p-n junction was characterized in terms of current-voltage (I-V) and capacitance-voltage (C-V) measurements. (C) 2003 Elsevier Ltd. All rights reserved. [References: 29]
机译:使用CH4 + CO2 + H-2气体混合物在SI底物上,通过直流等离子体化学蒸气沉积合成钻石膜。 确定最佳沉积条件。 发现0.4 A/cm(2)电流密度。 在1 kV的施加电压下,导致了优质的钻石膜。 底物温度为750 K,比传统的与1100 K的常规需求低得多。通过将硼酸通过溶解在甲醇中的硼酸将一部分气体混合物通过。 将硼掺杂的P型钻石膜沉积在N型单晶Si底物上,并制造了N-SI/P-Diamond异质结。 P-N连接的特征是电流电压(I-V)和电容 - 电压(C-V)测量值。 (c)2003 Elsevier Ltd.保留所有权利。 [参考:29]

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