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首页> 外文期刊>Acta crystallographica.Section D. Biological crystallography >Dark progression reveals slow timescales for radiation damage between T = 180 and 240 K.
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Dark progression reveals slow timescales for radiation damage between T = 180 and 240 K.

机译：黑暗的发展揭示了缓慢的时间表T = 180和240 K之间的辐射损伤。

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摘要

Can radiation damage to protein crystals be `outrun' by collecting a structural data set before damage is manifested? Recent experiments using ultra-intense pulses from a free-electron laser show that the answer is yes. Here, evidence is presented that significant reductions in global damage at temperatures above 200 K may be possible using conventional X-ray sources and current or soon-to-be available detectors. Specifically, `dark progression' (an increase in damage with time after the X-rays have been turned off) was observed at temperatures between 180 and 240 K and on timescales from 200 to 1200 s. This allowed estimation of the temperature-dependent timescale for damage. The rate of dark progression is consistent with an Arrhenius law with an activation energy of 14 kJ mol(-1). This is comparable to the activation energy for the solvent-coupled diffusive damage processes responsible for the rapid increase in radiation sensitivity as crystals are warmed above the glass transition near 200 K. Analysis suggests that at T = 300 K data-collection times of the order of 1 s (and longer at lower temperatures) may allow significant reductions in global radiation damage, facilitating structure solution on crystals with liquid solvent. No dark progression was observed below T = 180 K, indicating that no important damage process is slowed through this timescale window in this temperature range.
机译：辐射损伤蛋白质晶体可以吗“逃脱”通过收集结构数据集损害是体现?用超强脉冲自由电子激光显示,答案是肯定的。显著减少了吗全球温度高于200 K可能蒙受的损失使用传统的x射线源和可能当前的或即将探测器。具体来说,“黑暗的进展”(增加损伤后随着时间的x射线关闭)观察到温度之间180和240 K和时间尺度从200年到1200年年代。这使得估计的与温度有关的时间表的受损情况。率的黑暗的发展是一致的阿伦尼乌斯活化能的法律14 kJ摩尔(1)。的能量solvent-coupled扩散损失流程负责的迅速增加辐射敏感性晶体温暖高于200 K附近的玻璃化转变。表明在T = 300 K数据收集时间1 s的顺序(长在较低温度)允许显著减少全球辐射损伤,促进结构解决方案与液体溶剂晶体。发展观察T = 180 K以下,表明没有重要的破坏过程通过这个时间窗口在放缓温度范围内。

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