• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Applied optics >Analysis of a simple method for the reduction of phonon peak broadening in surface Brillouin Light Scattering
【24h】

Analysis of a simple method for the reduction of phonon peak broadening in surface Brillouin Light Scattering

机译：减少表面布里渊光散射中声子峰展宽的简单方法的分析

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

We present an investigation of the effect of the collecting lens aperture on the line shape of phonon peaks observed in surface Brillouin light scattering (SBLS) from surfaces of opaque materials and transparent thin films. In general, the broadening that is due to the aperture is asymmetric and can be as large as 60% of the peak frequency shift in the case of a f/1.4 aperture with an angle of incidence θ_(i) ＝ 30°. We calculated SBLS spectra accounting for the spread in scattering wave vectors across the collecting lens aperture, the polarization and angular dependence of the scattering, and the spectrometer instrumental function. By performing a detailed comparison between measured and calculated SBLS spectra for Si(001), we identified a set of simple rules for the placement of a rectangular slit in the collecting lens aperture to reduce the effects of aperture broadening. By use of a slit, the peak linewidths can be reduced substantially, without reducing the peak heights siguificantly, while eliminating false shifts in the measured frequency values.
机译：我们目前对不透明材料和透明薄膜表面的布里渊光散射（SBLS）中观察到的收集透镜孔径对声子峰线形的影响进行了研究。通常，由于光圈引起的展宽是不对称的，在f / 1.4光圈入射角θ_（i）＝ 30°的情况下，可以达到峰值频移的60％。我们计算了SBLS光谱，说明了散射波矢量在收集透镜孔径上的分布，散射的偏振和角度依赖性以及光谱仪的仪器功能。通过对Si（001）的SBLS光谱进行测量和计算的详细比较，我们确定了一套简单的规则，用于在收集透镜光圈中放置矩形狭缝，以减少光圈加宽的影响。通过使用狭缝，可以大幅减小峰值线宽，而不会显着降低峰值高度，同时消除了测得的频率值的错误偏移。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号