Bootstrap confidence intervals of C_(Npk) for exponentiated Frechet distribution

Srinivasa Rao Gadde; K. Rosaiah; Sridhar Babu Mothukuri

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Bootstrap confidence intervals of C_(Npk) for exponentiated Frechet distribution

机译：引导的置信区间C_(氮磷钾)取幂f分布

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Confidence intervals for process capability index using bootstrap method (Chen and Pearn, Qual Reliab Eng Int 13(6), 355-360, 1997) are constructed through simulation assuming that the underlying distribution is exponentiated Frechet distribution (EFD). Parameters are estimated by Maximum likelihood (ML) method. Also obtain the estimated coverage probabilities and average widths of the bootstrap confidence intervals through Monte Carlo simulation. Illustrate the process capability indices for EFD using some numerical examples.

机译：过程能力指数的置信区间使用引导方法(陈和Pearn战通过模拟假设构造潜在的分布是取幂邻分布(EFD)。最大似然(ML)方法。估计覆盖概率和平均引导置信区间的宽度通过蒙特卡罗模拟。过程能力指数使用EFD使用一些数值例子。

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来源
《Life Cycle Reliability and Safety Engineering》 |2019年第1期|33-41|共9页
作者
Srinivasa Rao Gadde; K. Rosaiah; Sridhar Babu Mothukuri;
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作者单位

Department of Statistics, The University of Dodoma;

Department of Statistics, Acharya Nagarjuna University;

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原文格式 PDF
正文语种英语
中图分类安全科学;
关键词
process capability analysis; Confidence intervals; Monte Carlo techniquemaximum likelihood estimationbootstrapping;

机译：过程能力分析;信心间隔;蒙特卡罗techniquemaximum可能性estimationbootstrapping;

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Bootstrap confidence intervals of C_(Npk) for exponentiated Frechet distribution

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