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Three-dimensional optical metrology with extended depth-measuring range using a holographic axilens

机译:Three-dimensional optical metrology with extended depth-measuring range using a holographic axilens

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摘要

A method of 3-D optical metrology based on a triangulation system using holographic axilens to increase the depth-measuring range without any decrease in the axial or the lateral resolution is presented. The element is designed according to an analytic ray-tracing optimization approach and is recorded as a computer-generated hologram. A sixfold increase in the depth-measuring range is experimentally obtained while nearly diffraction limited light spots are completely maintained.

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