Complete characterization of a high-numerical-aperture small-core fiber with subwavelength resolution using atomic force microscopy and near-field scanning optical microscopy

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Complete characterization of a high-numerical-aperture small-core fiber with subwavelength resolution using atomic force microscopy and near-field scanning optical microscopy

机译：Complete characterization of a high-numerical-aperture small-core fiber with subwavelength resolution using atomic force microscopy and near-field scanning optical microscopy

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摘要

The properties of a small-core high-numerical-aperture fiber are investigated using near-field scanning optical microscopy (NSOM). The microscopic structure of the fiber is also determined using a combination of etching and atomic force microscopy (AFM). Although the mode profile cannot be precisely predicted using AFM data alone, the measured profile is in extremely good agreement with that calculated using dimensional information provided by AFM and preform index data.

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《Optical Engineering》 |2003年第7期|1893-1895|共3页
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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
中图分类光学仪器;
关键词
optical fiber refractive index; mode field; atomic force microscopy; near-field scanning optical microscopy;

Complete characterization of a high-numerical-aperture small-core fiber with subwavelength resolution using atomic force microscopy and near-field scanning optical microscopy

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