...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Optical Engineering >Alternative method for measuring both the refractive indices and the thickness of silver-halide holographic plates
【24h】

Alternative method for measuring both the refractive indices and the thickness of silver-halide holographic plates

机译：Alternative method for measuring both the refractive indices and the thickness of silver-halide holographic plates

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相关主题

摘要

First, the phase differences between s- and p-polarizations of a circularly polarized heterodyne light beam reflected from the emulsion layer, and that from its substrate, are measured, respectively. The measured data are substituted into specially derived equations, so the refractive indices of the emulsion layer and its substrate can be calculated. Second, the variations of phase differences between s- and p-polarizations due to the wavelength shifts and the extraction of the holographic plate in a modified Michelson interferometer are measured. Then, the thickness of the emulsion layer and its substrate can be estimated based on the measured values of refractive indices, the wavelength shifts, and the phase difference variations. This method has some advantages, such as high resolution and easy operation in only one optical configuration.

著录项

获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号