Abstract Fourier ptychographic microscopy (FPM) can tackle the trade-off between the high resolution and the large field of view. However, the long capturing time limits its application. We propose a self-adapting search algorithm for FPM, termed SAS–FPM, which improves the data acquisition efficiency. Here the sparse arrangement is verified via simulations and experiments. Some results demonstrate the effectiveness and efficiency of this method. Compared to FPM with all-capturing mode, SAS–FPM could shorten the acquisition time by more than half.
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