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Tailoring of Photoluminescence Properties in All-Vacuum Deposited Perovskite via Ruddlesden-Popper Faults

机译:Tailoring of Photoluminescence Properties in All-Vacuum Deposited Perovskite via Ruddlesden-Popper Faults

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摘要

Ruddlesden-Popper (RP) faults are well known in oxide perovskites, and arealso observed in promising metal halide perovskites. However, the effectof RP faults on optical properties of perovskite has not been systematicallyinvestigated. In this study, it is found that RP faults are common planar faultsin all-vacuum deposited CsPbBr_3-based perovskite polycrystal thin films, andthe density of RP planar faults can be greatly increased by non-stoichiometriccomposition (Cs-rich) as well as reduced dimensionality (quasi-2D) strategies.The photoluminescence (PL) measurement reveals monotonically increasingpeak intensities with higher densities of RP planar faults from Cs-rich,quasi-2D to Cs-rich & quasi-2D samples. The corresponding atomic-scaledifferential phase contrast maps indicate strongly confined charges withinthe RP planar fault network, which explains well the relationship between PLenhancement and the density of RP planar faults, and offers an alternativepathway for tailoring the optoelectronic properties of perovskite.

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