Ways to improve the industry-wide system for metrological assurance of infrared optoelectronic devices

V. A. Baloev; V. I. Kurt; A. N. Shchipunov

首页> 外文期刊>Journal of optical technology >Ways to improve the industry-wide system for metrological assurance of infrared optoelectronic devices

【24h】

Ways to improve the industry-wide system for metrological assurance of infrared optoelectronic devices

机译：Ways to improve the industry-wide system for metrological assurance of infrared optoelectronic devices

获取原文

获取原文并翻译 | 示例

掌桥外文数据库（机构版） >>

开具论文收录证明 >>

文献代查 >>

页面导航

摘要
著录项
相关主题

摘要

This paper discusses problems of the metrological assurance of the production, testing, and operation of IR optoelectronic devices and proposes ways to improve systems for the metrological assurance of IR optoelectronic devices.

著录项

来源
《Journal of optical technology》 |2007年第3期|152-158|共7页
作者
V. A. Baloev; V. I. Kurt; A. N. Shchipunov;
展开▼
作者单位

NPO State Institute of Applied Optics, Kazan;

State Scientific Research Institute, mytishchi, Moscow Oblast;

展开▼
收录信息
原文格式 PDF
正文语种英语
中图分类光学;
关键词

客服邮箱：kefu@zhangqiaokeyan.com

客服微信
服务号

Ways to improve the industry-wide system for metrological assurance of infrared optoelectronic devices

摘要

著录项

相关主题

期刊订阅