A method of mathematical optimization is proposed to obtain an exact solution to the problem of finding the extremum. The method, called the direct search method, is implemented within the BARD analytical program package (Basic Analysis of Reflectometry Data). As an illustration of the application of the method, the solution of the inverse problem of reflectometry in the framework of a step model of the electronic profile for a monolayer of porphyrin-fullerene dyads is given. An example of finding the structural parameters of a molecular Langmuir layer on an aqueous subphase based on grazing incidence diffraction data is also proposed.
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