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首页> 外文期刊>IEEE Journal of Solid-State Circuits >An On-Chip Relaxation Oscillator in 5-nm FinFET Using a Frequency-Error Feedback Loop
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An On-Chip Relaxation Oscillator in 5-nm FinFET Using a Frequency-Error Feedback Loop

机译:An On-Chip Relaxation Oscillator in 5-nm FinFET Using a Frequency-Error Feedback Loop

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摘要

Availability of a reliable ON-chip oscillator can secure a system-on-chip (SoC) against physical clock attacks by enabling applications such as boot-up using ON-chip oscillator and hardware clock monitors. This article proposes a frequency-error feedback (FEF) loop-based relaxation oscillator for such applications. It suppresses the low-frequency noise and improves the time interval error (TIE) without degrading the period jitter. It also stabilizes the oscillator against supply and temperature variations. A 77-MHz oscillator prototype is fabricated in a commercial 5-nm FinFET process. Operating from 0.9-V digital and 1.2-V analog supplies, the prototype consumes a total of 0.84 mW and occupies an area of 0.0152 mm 2 . It achieves a TIE of 3 ns over 10 K cycles which is $3times $ better than an oscillator without an FEF loop. Chip samples are picked from four wafer split lots. The worst case frequency variation measured from 16 samples is $pm 0.25%$ across an analog supply change of 1.1–1.35 V, while a variation of $pm 0.3%$ is measured over ?40 to $125 ^circ text{C}$ temperature from eight samples.

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