...
首页> 外文期刊>Electric Power Systems Research >Channel charge density behind commonly used return stroke engineering model
【24h】

Channel charge density behind commonly used return stroke engineering model

机译:Channel charge density behind commonly used return stroke engineering model

获取原文
获取原文并翻译 | 示例
           

摘要

The evolution characteristics behind the commonly used return stroke engineering model have not been fully understood, which limits the accurate estimation on the lightning damage effect. Therefore, the line charge densities behind the TL, MTLL MTLE, BG, TCS and DU models are discussed under three cases: (a) constant velocity with traditional attenuation function, (b) exponentially decreasing velocity with traditional attenuation function, and (c) exponentially decreasing velocity with improved attenuation function considering time factor. As height increases, the charge density behind the TL, MTLL and MTLE models in case (c) is between that in case (a) and (b). However, owing to the reduction of the inputting charge from the channel base and the gradually prominent deposition effect of the residual charge, the total charge densities in the three cases trend to be consistent with each other in the end. Additionally, the results suggest that the near-region radiated fields yielded by the traditional return stroke model (case (a)) may be smaller than the actual observation. For the BG, TCS and DU models, the connotative charge density is mainly the deposited charge density component. Although the charge density decreases overall with height, the waveform exhibits a "hump" at the height of about 2 km~3 km. The presented results may be of assistance in understanding the commonly used engineering model, as well as in performing more effective protection against lightning hazards.

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号