...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Review of Scientific Instruments >A new method for detecting surface defects on curved reflective optics using normalized reflectivity
【24h】

A new method for detecting surface defects on curved reflective optics using normalized reflectivity

机译：A new method for detecting surface defects on curved reflective optics using normalized reflectivity

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相关主题

摘要

Detection of surface defects is critical in quality control of reflective optics. In this note, we propose a new surface defect detection method for reflective optics using the normalized reflectivity, which is calculated from the signal intensity of a chromatic confocal surface profiler. This detection method first scans the surface to acquire signal intensity data and then models the intensity data to calculate the normalized local reflectivity map. The reflectivity map is further processed by threshold segmentation to extract defects from normal areas. Measurement experiments on an Al-coated concave reflector with artificial defects were carried out to demonstrate the feasibility of the method. This detection method can provide existing optical surface profilers with defect detecting capabilities without extra equipment. Published under license by AIP Publishing.

著录项

获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号