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Temperature dependent charge transport in electrostatically doped polybenzimidazobenzophenanthroline thin films

机译:Temperature dependent charge transport in electrostatically doped polybenzimidazobenzophenanthroline thin films

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摘要

Abstract Charge transport in electrostatically doped poly[benzimidazobenzophenanthroline]‐BBL thin films in a field‐effect transistor geometry were investigated in the temperature range 150 K  335 K which depended on Vg. Enhanced electron delocalization combined with increased carrier density could be responsible for this “metallic‐like” behavior. Our results show that the existence of deep traps with multiple energy distributions, combined with increased carrier density led to the unusual temperature dependence of charge transport observed in BBL.

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