An apparatus for the continuous measurement of thickness during the electropolishing of superconducting cavities

Bertucci M.; Bosotti A.; Campari R.DAmbros A.Gresele A.Grimaldi A. T.Michelato P.Monaco L.Pagani C.Paparella R.Pistoni N. C.Rizzi M.Sertore D.Torri A.

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An apparatus for the continuous measurement of thickness during the electropolishing of superconducting cavities

机译：An apparatus for the continuous measurement of thickness during the electropolishing of superconducting cavities

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An apparatus allowing continuous acquisition of thickness measurements during electropolishing of superconducting cavities is described. The instrument is based on the ultrasound thickness measurement technique and allows the connection of up to six probes. The apparatus has been employed to monitor the surface treatment of PIP-II low beta single cell prototypes developed and manufactured by LASA-INFN and specifically to measure surface removal at different points of interest on the cavity surface. The apparatus facilitated the development and optimization of electropolishing parameters for incorporation into the cavity manufacturing process.

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《Review of Scientific Instruments》 |2021年第2期|023307-1-023307-8|共8页
作者
Bertucci M.; Bosotti A.; Campari R.DAmbros A.Gresele A.Grimaldi A. T.Michelato P.Monaco L.Pagani C.Paparella R.Pistoni N. C.Rizzi M.Sertore D.Torri A.;
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Ist Nazl Fis Nucl, Sez Milano, Lab LASA, Via Fratelli Cervi 201, I-20090 Milan, Italy;

CELM Sas, Via Giovanni XXIII 1, I-26020 Madignano, Cremona, Italy;

Zanon Res & Innovat Srl, Via Vicenza 113, I-36015 Vicenza, Italy;

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An apparatus for the continuous measurement of thickness during the electropolishing of superconducting cavities

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