Tunable reflective Fourier ptychographic microscopy using a digital micromirror device and an LED source

Pham Van Huan; Chon Byong Hyuk; Ahn Hee Kyung

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Tunable reflective Fourier ptychographic microscopy using a digital micromirror device and an LED source

机译：Tunable reflective Fourier ptychographic microscopy using a digital micromirror device and an LED source

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摘要

We propose a tunable reflective Fourier ptychographic microscopy approach in which the resolution and field of view are variable with different objective lenses and a digital micromirror device. Several objective lenses are applied to tunable reflective Fourier ptychographic microscopy without additional optical alignment while also enhancing the resolution. To demonstrate the feasibility of the new technique, tunable reflective Fourier ptychographic microscopy with 10 x and 50 x objective lenses is demonstrated. Moreover, we compare the resolution of the new technique and conventional Fourier ptychographic microscopy to verify the improved resolution of the new technique.

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《Optical Engineering》 |2023年第4期|044106-1-044106-10|共10页
作者
Pham Van Huan; Chon Byong Hyuk; Ahn Hee Kyung;
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作者单位

Korea Res Inst Stand & Sci;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
中图分类光学仪器;计量学;
关键词
quantitative phase microscopy; phase retrieval technique; digital micromirror device; Fourier ptychographic microscopy; MISALIGNMENT CORRECTION METHOD; SYNTHETIC-APERTURE MICROSCOPY; HIGH-RESOLUTION; WIDE-FIELD; DIFFRACTION TOMOGRAPHY; HOLOGRAPHIC MICROSCOPY; PHASE RETRIEVAL; HIGH-THROUGHPUT; FULL-FIELD; ILLUMINATION;

Tunable reflective Fourier ptychographic microscopy using a digital micromirror device and an LED source

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