机译:Life-cycle modeling driven by coupling competition degradation for remaining useful life prediction
School of Mechanical Engineering Xi'an Jiaotong University||State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University;
School of Mechanical Engineering Xi'an Jiaotong University||The Department of Electronic and Electrical Engineering Brunel University London;
School of Mechanical Engineering Xi'an Jiaotong UniversitySchool of Mechanical Engineering Xi'an Jiaotong University||State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University||;
Coupling competition degradation mechanism (CCDM); Deep Markov model (DMM); Degradation indictor (DI); Life-cycle modeling; Remaining useful life (RUL) estimation;