机译:Twin-Boundary Reduced Surface Diffusion on Electrically Stressed Copper Nanowires
Natl Tsing Hua Univ;
Natl Yang Ming Chiao Tung Univ;
City Univ Hong Kong;
nanotwin; surface diffusion; electromigration; copper nanowire; atomic migration energy; CU; ELECTROMIGRATION; GRAPHENE; AL;