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Surface Defect Suppression for High Color Purity Light-Emitting Diode of Free-Standing Single-Crystal Perovskite Film

机译:Surface Defect Suppression for High Color Purity Light-Emitting Diode of Free-Standing Single-Crystal Perovskite Film

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摘要

High color purity is one of the important features for single-crystal metalhalide perovskite light-emitting diode (LED). Despite single-crystal perovskiteshowing low bulk defect concentration, single-crystal perovskite LEDs donot exhibit high color purity advantage due to the absence of effective surfacedefect passivation. Herein, one fully wrapped structure is proposed topassivate the surface of the free-standing CsPbBr3 single-crystal films. Thesurface of CsPbBr_3 single-crystal films is wrapped by ultra-thin polymethylmethacrylate, precisely controlling the thickness. The single-crystal perovskitefilm device can achieve high color purity with a full width at half maximum(FWHM) of 15.8 nm) and a large luminescent area of 2.25 mm~2. It is observedthat surface passivation is due to interaction of C=O bond in polymer chainswith the Lewis acid PbBr2. The passivated perovskite single-crystal filmssignificantly improve carrier lifetime and suppress surface defects. It is noteworthythat the passivated free-standing single-crystal perovskite films arefeasible to build up a vertical LED device structure, avoiding the edge glowingand short-circuiting of the LED device. This study demonstrates the largeluminescent area of the high-quality millimetre-scale free-standing singlecrystalfilms for wide color gamut display and vertical optoelectronic devices.

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