Simultaneous and precision measurement of yaw and pitch using digital speckle pattern interferometry

Fan Wu; Sijin Wu; Weixian LiXin Li

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Simultaneous and precision measurement of yaw and pitch using digital speckle pattern interferometry

机译：Simultaneous and precision measurement of yaw and pitch using digital speckle pattern interferometry

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摘要

A method of simultaneous and precision measurement of yaw and pitch based on digital speckle pattern interferometry is proposed. The relationship between the yaw/pitch and phase distribution is analyzed in detail, resulting in the establishment of the yaw and pitch simultaneous measurement model. A plane fitting method is proposed to separate the two angle motions from a single phase map. The proposed method enjoys the advantages of being free of cooperative target, high-resolution measurement, and compact optical setup. Experimental results show the mean absolute error of the measurement is <1 μrad.

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来源
《Optical Engineering》 |2021年第3期|034103-1-034103-11|共11页
作者
Fan Wu; Sijin Wu; Weixian LiXin Li;
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作者单位

Beijing Information Science and Technology University, School of Instrumentation Science and Optoelectronics Engineering, Beijing, China;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
中图分类计量学;
关键词
degree-of-freedom; angle motions; yaw; pitch; digital speckle pattern interferometry;

Simultaneous and precision measurement of yaw and pitch using digital speckle pattern interferometry

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