A laboratory xhyphen;ray absorption spectrometer is described which consists of a Johanssonhyphen;cut bent crystal, a rotating anode xhyphen;ray generator, and a fast SSD (solidhyphen;state detector). Because the SSD can completely discriminate the undesired reflections, contamination of the harmonics is avoided while maintaining a highhyphen;source voltage necessary for strong xhyphen;ray flux. Fast electronics equipment is employed to keep up with highhyphen;xhyphen;ray intensity. It is also possible to utilize higherhyphen;order reflections for high resolving power. The data of quality comparable to those obtained at synchrotron radiation facilities can be obtained in a comparable period of time. In addition, the determination of the absolute absorbance as defined is possible, which makes the problem of the background subtraction in EXAFS analysis easy.
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