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Measurement of second-harmonic optical susceptibility using Rayleigh scattering

机译:Measurement of second-harmonic optical susceptibility using Rayleigh scattering

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摘要

We report a simple method to measure relative second-harmonic optical susceptibilities of crystals by use of Rayleigh scattering. We use two crystals with fixed alignments: one is a phase-matched crystal with varying degrees of phase matching, which serves as a reference point of the phase relationship and a source for the second-harmonic beam to be incident on the sample crystal, and the other is a sample crystal for measurement. The second-harmonic signals generated from each of the two crystals are superposed in the sample crystal to give Rayleigh scattering at the second-harmonic frequency, the analysis of which can determine the relative values of the second-harmonic optical susceptibilities of the sample crystals. We have applied this method to obtaind14(KDP)≃1.8d36(KDP),d36(ADP)≃1.1d36(KDP),d31(KTP)≃15d36(KDP),d32(KTP)≃13d36(KDP), whered36of KDP crystals was taken as a re

著录项

  • 来源
    《optical and quantum electronics》 |1993年第11期|853-858|共页
  • 作者

    JongHyunKim; Jong-JeanKim;

  • 作者单位

    Korea Advanced Institute of Science and Technology;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类
  • 关键词

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