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首页> 外文期刊>Optical and Quantum Electronics >ANALYSIS OF TEM(OO) LASER BEAM QUALITY DEGRADATION CAUSED BY A BIREFRINGENT ND-YAG ROD
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ANALYSIS OF TEM(OO) LASER BEAM QUALITY DEGRADATION CAUSED BY A BIREFRINGENT ND-YAG ROD

机译:ANALYSIS OF TEM(OO) LASER BEAM QUALITY DEGRADATION CAUSED BY A BIREFRINGENT ND-YAG ROD

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摘要

The effects produced by a birefringent rod on the beam quality factor, M(r)(2), of a Gaussian TEM(00) laser beam are studied. Analytical expressions for the beam parameters at the output plane of a rod amplifier are derived. The theory predicts that the beam quality degrades rapidly with the heat power dissipated in the rod. References: 17

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