The preparation and demonstration of epitaxial La0.67Sr0.33Mn3-delta films/((110) orientation)

Xiong CS.; Xiong YH.; Jia YB.Zhou GE.Jian ZP.Li XG.Pi L.

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The preparation and demonstration of epitaxial La0.67Sr0.33Mn3-delta films/((110) orientation)

机译：The preparation and demonstration of epitaxial La0.67Sr0.33Mn3-delta films/((110) orientation)

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The X-ray diffraction patterns and pole figures of the La0.67Sr0.33MnO3-delta films, which were fabricated on (110) LaAlO3 single-crystal substrates using the direct current magnetron sputtering technique were studied systematically. It is concluded that all films are high-quality epitaxial films and there is a perfect matching relationship between the films and the substrates. The effect of the different orientations ((110) and (100)) on the resistivity and metal-insulator transition temperature is briefly discussed. (C) 2000 Elsevier Science Ltd. All rights reserved. References: 12

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《Solid State Communications》 |2000年第6期|341-345|共5页
作者
Xiong CS.; Xiong YH.; Jia YB.Zhou GE.Jian ZP.Li XG.Pi L.;
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Univ Sci & Technol China, Struct Res Lab, Hefei 230026, Anhui, Peoples R China.;

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正文语种英语
中图分类固体物理学;
关键词
Thin films; Epitaxy; Crystal structure and symmetry; Electronic transport; X-ray and gamma-ray spectroscopies; Thin-films; Magnetoresistance; Resistivity;

The preparation and demonstration of epitaxial La0.67Sr0.33Mn3-delta films/((110) orientation)

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