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Electron irradiation of poly(olefin sulfones). Application to electron beam resists

机译:Electron irradiation of poly(olefin sulfones). Application to electron beam resists

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AbstractAll the poly(olefin sulfones) examined degraded rapidly under electron irradiation. The dose required to effect a molecular weight distribution completely separated from the original distribution as required for fractional solution development was similar for all polymers, viz., 1–2 × 10−6coulomb/cm2. This indicates that they all have similar values forG(scission). The film thickness of the exposed area decreased at a rate dependent on olefin structure and temperature. This process, termed vapor development, has been attributed to concurrent chain scission and depolymerization. Factors determining the rate of depropagation are discu

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