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An Apparatus for Study of Secondary Ions from Ion Bombardment of a Metal Surface

机译:An Apparatus for Study of Secondary Ions from Ion Bombardment of a Metal Surface

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An apparatus for the study of secondary positive and negative ions from metal surfaces under positive ion bombardment has been constructed in stainless steel using ultrahyphen;high vacuum technology. It provides for triple mass analysis (i.e., of primary and both secondary beams), and energy analysis of the secondary ions. A retarding technique suitable for wide energy distributions has been developed. Some preliminary results obtained are given.

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