Evaluation of Atomic Layer Stacking Structure and Curie Temperature of Magnetic Films for Thermally Assisted Recording Media (Invited)

Shin Saito; Shintaro Hinata; Migaku Takahashi

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Evaluation of Atomic Layer Stacking Structure and Curie Temperature of Magnetic Films for Thermally Assisted Recording Media (Invited)

机译：Evaluation of Atomic Layer Stacking Structure and Curie Temperature of Magnetic Films for Thermally Assisted Recording Media (Invited)

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Thermally assisted recording system is a promising candidate to overcome the trilemma of perpendicular magnetic recording hard disk drive development. In this paper, we introduce our current research about evaluation for the media material. In-plane X-ray diffraction technique is effective to evaluate atomic layer stacking structure of (111)-oriented face-centered cubic, c-plane-oriented hexagonal closed packed (hcp), and their intermediate structure with stacking faults of CoPt alloy thin film. Analytical results of Co_(50)Pt_(50)-based thin film shows that changing the valence electron number closer to 9 can effectively reduce the stacking fault. In practical, perfect hcp atomic layer stacking can be achieved by substituting Pt (group 10) with Rh (group 9). High-angle annular dark field of scanning transmission electron microscopy with probe diameter of 1 A can effectively observe composition modulated atomic layer stacking with the super-lattice diffraction in Co-based alloy films. In practical, for Co_(80)M_(20) (M: Ir, Pt) thin film sputtered under high substrate temperature, the irregular or alternately layered structure of M rich and M poor layer can be observed directly. To evaluate Curie temperature (T_C), which is an important physical property of thermally assisted media, conduction electron spin-dependent scattering should be the focus. Fitting dielectric spectra for MnSb thin film with T_C ～ 320 ℃ measured with the ellipsometry and analyzing the Drude's term, temperature dependence of resistivity and scattering time at around T_C was confirmed.

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《IEEE Transactions on Magnetics》 |2014年第1期|3201205-1-3201205-5|共5页
作者
Shin Saito; Shintaro Hinata; Migaku Takahashi;
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作者单位

Department of Electronic Engineering, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan;

New Industry Creation Hatchery Center, Tohoku University, Sendai 980-8579, Japan;

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中图分类计量学;
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Evaluation of Atomic Layer Stacking Structure and Curie Temperature of Magnetic Films for Thermally Assisted Recording Media (Invited)

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