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Use of EXAFS to probe electrode–solution interfaces

机译:Use of EXAFS to probe electrode–solution interfaces

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摘要

AbstractA review of the development and application of extended X‐ray absorption fine structure (EXAFS) spectroscopy for in situ structural characterization of chemical processes at he electrode surface is presented. The designs of the in situ electrochemical cells developed to date are shown. Applications are presented from the areas of metal passivation, spectroelectrochemistry, modified electrodes, underpotential deposition, and adsorptio

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  • 来源
    《electroanalysis》 |1991年第3期|145-155|共页
  • 作者

    Howard D. Dewald;

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  • 正文语种 英语
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