首页> 外文期刊>journal of applied polymer science >Residual stress in particulate epoxy resin by X‐ray diffraction
【24h】

Residual stress in particulate epoxy resin by X‐ray diffraction

机译:Residual stress in particulate epoxy resin by X‐ray diffraction

获取原文
           

摘要

AbstractResidual stress in particulate epoxy resin was investigated by X‐ray diffraction. Microdeformation of incorporated Al and α‐SiO2crystal, which was induced by the residual stress, could be detected as a shift of X‐ray diffraction peak. The residual stress at the interface between the adherend and the particulate epoxy resin was found to decrease with the increase of volume fraction of filler. It was shown that the difference in the thermal expansion coefficients between the adherend and the particulate epoxy resin is much more effective on residual stress than the increment of Young's modulus owing to the incorporation of filler. When epoxy resin was cured on the Al plate, incorporated particles were subjected to a tensile stress; while cured on polytetrafluoroethylene sheet, particles were subjected to a compressive stress. The incorporation of some inorganic particles is considered effective to reduce the residual

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号