The calibrations, time responses, and Hugoniot for carbon piezoresistive gauges from two manufacturers are presented. These gauges exhibit a high sensitivity of about minus;20percnt; resistance change per GPa at 0.5 GPa. Their equilibration times, when tested in fused silica, exceed 0.6 mgr;sec below 0.5 GPa but improve at higher stresses and under better impedance matching conditions. They can be made of low atomic number materials, making them interesting candidates for studying the mechanical responses of materials to electron and xhyphen;ray deposition.
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