Scanning tunneling microscopy and spectroscopy study of charge inhomogeneities in bilayer graphene

Choudhary S.K.; Gupta A.K.

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Scanning tunneling microscopy and spectroscopy study of charge inhomogeneities in bilayer graphene

机译：Scanning tunneling microscopy and spectroscopy study of charge inhomogeneities in bilayer graphene

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摘要

We report a room-temperature scanning tunneling microscopy and spectroscopy study of bilayer graphene prepared by mechanical exfoliation on a SiO _2Si surface and electrically contacted with gold pads using a mechanical mask. The bulk conductivity shows contributions from regions of varying electron density, indicating significant charge inhomogeneity. Large-scale topographic images show ripple-like structures with a roughness of ～1 nm, while the small-scale atomic resolution images show graphite-like triangular lattices. The local (dIdVV) tunnel spectra have an asymmetric V-shape with the minima location showing significant spatial variation, indicating inhomogeneity in electron density of order 10~(11) cm~(-2). The minimum in spectrum at a fixed location also shifts linearly with the gate voltage with a slope consistent with the field-induced carrier density.

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来源
《Solid State Communications》 |2011年第5期|396-399|共4页
作者
Choudhary S.K.; Gupta A.K.;
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作者单位

Department of Physics, Indian Institute of Technology Kanpur, Kanpur 208016, India;

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原文格式 PDF
正文语种英语
中图分类固体物理学;
关键词
A. Graphene; D. Electronic inhomogeneities; E. Scanning tunneling microscopy and spectroscopy;

Scanning tunneling microscopy and spectroscopy study of charge inhomogeneities in bilayer graphene

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