Controlled Molecular Alignment in Phthalocyanine Thin Films on Stepped Sapphire Surfaces

J. Oriol; Frank Schreiber; Volker KruppaHelmut DoschMiquel GarrigaM. Isabel AlonsoFernando Cerdeira

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Controlled Molecular Alignment in Phthalocyanine Thin Films on Stepped Sapphire Surfaces

机译：Controlled Molecular Alignment in Phthalocyanine Thin Films on Stepped Sapphire Surfaces

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We report a detailed study of the growth and structure of thin films of copper hexadecafluorophthalocyanine (F_(16)CuPc) on sapphire. These films show very good out-of-plane order and have X-ray rocking widths of around 0.02°. If prepared under suitable conditions on A-plane sapphire substrates, the molecules align without significant azimuthal dispersion. Growth on MgO (001) and oxidized silicon wafers resulted in a comparable out-of-plane structure, but showed no azimuthal order. We find that the azimuthal alignment on sapphire is induced by the step edges along the c-axis of the sapphire, which serve as templates for the growth. For growth at different substrate temperatures, we find a monotonic change of the molecular out-of-plane tilt angle, as obtained from Raman scattering, which is accompanied by a change of the out-of-plane lattice parameter.

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《Advanced functional materials》 |2002年第7期|455-460|共6页
作者
J. Oriol; Frank Schreiber; Volker KruppaHelmut DoschMiquel GarrigaM. Isabel AlonsoFernando Cerdeira;
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Max-Planck-Institut fur Metallforschung Heisenbergstr. 1, D-70569 Stuttgart (Germany);

Institut fur Theoretische und Angewandte Physik, Universitat Stuttgart D-70550 Stuttgart (Germany);

Institut de Ciencia de Materials de Barcelona, CSIC E-08193 Bellaterra (Spain)Instituto de Fsica "Gleb Wataghin", UNICAMP 13.083-970 Campinas S.P. (Brazil);

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中图分类无线电电子学、电信技术;
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Controlled Molecular Alignment in Phthalocyanine Thin Films on Stepped Sapphire Surfaces

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