机译:Structural and optical characterization of Si-implanted Al0.18Ga0.82N
Kangwon Natl Univ, Dept Phys, Chunchon 200701, Kungwon Do, South Korea.;
USAF, Inst Technol, Dept Engn Phys, Wright Patterson AFB, OH 45433 USA.;
Semiconductors; X-ray scattering; Optical properties; Luminescence;