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A MACHINE VISION TECHNIQUE FOR SUBPIXEL ESTIMATION OF THREE-DIMENSIONAL PROFILOMETRY

机译:A MACHINE VISION TECHNIQUE FOR SUBPIXEL ESTIMATION OF THREE-DIMENSIONAL PROFILOMETRY

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摘要

A quick and efficient technique for a charge-coupled device (CCD)-based profilometric measurement system is proposed and verified by experiment. When a laser stripe is projected onto an object, the deformed laser line image is detected by a CCD camera with subpixel resolution and is automatically transferred to its space position using a least-squares mapping algorithm. Measurements are executed on each separate surface of a three-dimensional object and the multi-surface data are integrated through a process of coordinate transformation. Large arrays of data points are acquired on each surface by means of a scanning mechanism. Because the measuring data from each laser stripe position can provide two-dimensional information concerning the surface contour, the laser stripe and the CCD camera are integrated into a measurement system for obtaining the entire three-dimensional information. Theoretical analysis shows that this technique can determine the three-dimensional profile of an object with an accuracy below 0.2 mm. References: 11

著录项

  • 来源
    《Optical and Quantum Electronics》 |1996年第10期|1571-1582|共12页
  • 作者

    Tai WC.; Chang M.;

  • 作者单位

    CHUNG YUAN CHRISTIAN UNIV DEPT ENGN MECH CHUNGLI 320 TAIWAN;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 光学;
  • 关键词

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