Thickness dependence of positive exchange bias in ferromagnetic/ antiferromagnetic bilayers

Xu X.-Y.; Gao Y.-J.; Wang Y.-L.Hu J.-G.

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Thickness dependence of positive exchange bias in ferromagnetic/ antiferromagnetic bilayers

机译：Thickness dependence of positive exchange bias in ferromagnetic/ antiferromagnetic bilayers

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摘要

For the ferromagnetic (FM)/antiferromagnetic (AFM) bilayers, both negative and positive exchange bias ~(HE) have been observed for low and high cooling field HCF, respectively. The thickness dependence of ~(HE) and coercivity ~(HC) have been investigated for the cases of negative and positive ~(HE). It is found that the negative ~(HE) and the positive one have similar FM thickness dependence that is attributed to the interfacial nature of exchange bias. However, the AFM thickness dependence of positive HE is completely contrary to that of the negative one, which clearly demonstrates that the AFM spins play different roles for the cases of positive and negative ~(HE.) In particular, the AFM thickness of positive ~(HE) was first highlighted by an AFM spin canting model. These results should be attributed to the interfacial spin configuration after field cooling procedure.

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来源
《Solid State Communications》 |2011年第13期|952-955|共4页
作者
Xu X.-Y.; Gao Y.-J.; Wang Y.-L.Hu J.-G.;
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作者单位

School of Physics Science and Technology, Yangzhou University, No. 180, Siwangting Road, Yangzhou City 225002, China;

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正文语种英语
中图分类固体物理学;
关键词
A. FM/AFM bilayers; C. Spin configuration; D. Exchange bias;

Thickness dependence of positive exchange bias in ferromagnetic/ antiferromagnetic bilayers

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