Blind deconvolution of x-ray diffraction profiles by using high-order statistics

Jinghe Yuan

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Blind deconvolution of x-ray diffraction profiles by using high-order statistics

机译：Blind deconvolution of x-ray diffraction profiles by using high-order statistics

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摘要

A high-order statistical-based, blind deconvolution algorithm is proposed for x-ray powder diffraction profiles. Maximizing the kurtosis amplitude of the deconvolved data ensures that only the data with maximized kurtosis amplitude is extracted. The ill-posed nature of deconvolution is, thus, bypassed. Using simulation and experiments, this method is seen to be very robust with respect to noise. The profile resolution is enhanced considerably, and the deconvolved profile fits the pseudo-Voigt profile nicely. However, noise is enhanced in the deconvolved data, so the algorithm may be invalid for experimental data with low signal-to-noise.

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来源
《Optical Engineering》 |2009年第7期|076501-1-076501-5|共5页
作者
Jinghe Yuan;
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作者单位

Yantai University, Institute of Science and Technology for Opto-Electronic Information, Yantai 264005, China;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
中图分类计量学;
关键词
x-ray diffraction; blind deconvolution; high-order statistics;

Blind deconvolution of x-ray diffraction profiles by using high-order statistics

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